Technical Name Nantwinned Cu for packaging of AI3D IC chips
Project Operator National Chiao Tung University
Project Host 陳智
Summary
Our research group have developed a brand-new method for electroplating nano-twinned copper, which have potential applications for microelectronic products of next generation. The nanotwinned Cu possesses high strength, high electromigration resistance, high thermal stability, high surface diffusivity,low surface oxidation rate. It can be utilized in many aspects of microelectronic products s
Scientific Breakthrough
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Industrial Applicability
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